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High Precision White Light Interferometry / Vertical Scanning Interferometry

    Buy cheap High Precision White Light Interferometry / Vertical Scanning Interferometry from wholesalers
     
    Buy cheap High Precision White Light Interferometry / Vertical Scanning Interferometry from wholesalers
    • Buy cheap High Precision White Light Interferometry / Vertical Scanning Interferometry from wholesalers

    High Precision White Light Interferometry / Vertical Scanning Interferometry

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    Brand Name : Rational
    Model Number : White Light Interferometer
    Certification : CE SGS ISO
    Price : Negotiable
    Payment Terms : L/C, D/A, D/P, T/T
    Supply Ability : 10000 set per month
    Delivery Time : After received down payment 5-15workdays
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    High Precision White Light Interferometry / Vertical Scanning Interferometry

    High Precision White Light Interferometry / Vertical Scanning Interferometry


    Product brief:


    Combined with microscope and interferometer, the White Light Interferometer, with 3D measurement of vertical scanning height of 400um, is suitable for outline and profile measurement of various materials and micro components. This instrument doesn’t need program amended by complex light. It’s widely used in glass lens, surface of coating film, wafer, disk, MEMS(micro electro mechanical system), plane LCD, high density PCB, IC packaging, material analysis, micro surface research, etc.

    Features:


    1. 3D measurement for nanoscale object.
    2. High speed and non-contact.
    3. Analysis of surface, profile and roughness.
    4. Transparent or non-transparent materials available.
    5. Non-electron beam and non-laser security measurement.
    6. Low-cost maintenance.

    Professional 3D graphic processing and analyzing software (Post Topo):
    1. user-friendly human-computer interface.
    2. Self-calibration for advanced standard film.
    3. Linear analysis or regional analysis is available when analyzing depth and height.
    4. Linear analysis is available in roughness or waviness defined by ISO.
    5. 17 measuring specifications and 4 additional measuring data available.
    6. Regional analysis is available in graphic analysis or statistic analysis.
    7. 2D Fast Fourier Transform (FFT) processing feature like smoothing, sharpening, and digital filtration wave.
    8. Analysis result output into multiple graphic files like BMP, or into Excel format by interferometer analyzing software, ImgScan.


    High speed and high precision Interference Analysis Software (ImgScan):


    1. The system’s hardware is configured with ImgScan pre-processing software to automatically analyze white-light fringe.
    2. Vertical height is up to 0.1nm.
    3. High speed computing and analyzing software.
    4. The setup of vertical scanning range is easy and simple.
    5. Lens is available in 10X, 20X or 50X.
    6. Numerical display of X, Y and Z axis, which makes measured object faster and more convenient to detect.
    7. Manual/ automatic brightness is available to acquire the best comparison of white-light fringe.
    8. Available in high precision PVSI scanning measurement mode or high speed VSI scanning measurement mode.
    9. Patented analyzing software is suitable for measuring 3D profile of semi-transparent object.
    10. Auto-repair point.
    11. Scanning direction can be set by user.

    Specifications:


    ModelAE-100M
    Moving Table (mm)Size: 100*100, travel: 13*13
    Lens Magnification10X20X50X
    Observing /Measuring Range (mm)0.43*0.320.21*0.160.088*0.066
    Resolution (μm)0.920.690.5
    Degrees172333
    Working distance7.44.73.4
    Sensor’s resolutionpixel: 640*480
    Weight/ Load (kg)20kg/ Less than 1kg
    Z-axis travel45mm (manually fine tuning)
    Z-axis digital displayResolution: 1μm
    Inclined adjusting platformBiax/ Manual adjustment
    Height measurement
    Measuring range100(μm)(400μm. Optional configuration)
    Resolution0.1nm
    Repeated accuracy≤ 0.1% (Measuring height>10μm)
    ≤10nm(Measuring height1μm 10μm)
    ≤ 5nm(Measuring height <1μm )
    Measuring control systemAutomatic
    Scanning speed (μm/s)12 (the fastest)
    Illumination
    TypeHalogen lamp
    Average lifespan1000h 100W 500h(150W)
    BrightnessAutomatically / Manually adjust
    Data processing and computer
    Central processing and computing displayDual core+ CUP
    Video and data processing display17 " LCD screen
    OSWindows XP(2)
    Power supply and environmental requirementsAC100 --240 V 50-60Hz
    Environmental vibrationVVC-C plus level
    Measuring and analyzing softwares
    Measuring software ImgScanMeasuring software ImgScan: available in VSI/PVSI/PSI measuring mode (PSI measuring mode must be configured with PSI module)
    Analyzing software PosTopoISO roughness / height analysis, multiple 2D and 3D fast fourier transforms.
    Observe viewing graph like outline; outline, area, and volume analysis; graph zooming; video file format conversion.
    Report output; program teach-in measurement.



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